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PUBLICATIONS

Angularly-Selective Transmission Imaging in a Scanning Electron Microscope

Published

Author(s)

Jason D. Holm, Robert R. Keller

Abstract

This contribution presents recent advances in imaging control conditions for transmission scanning electron microscopy (t-SEM) by means of angularly-selective electron collection with a commercial scanning transmission electron microscopy-in-scanning electron microscope (STEM-in-SEM) detector. A modular aperture system that can enhance the imaging capabilities of nearly any transmission detector is described, and several imaging examples are provided.
Citation
Ultramicroscopy
Volume
167
Pub Type
Journals

Download Paper

https://doi.org/10.1016/j.ultramic.2016.05.001

Keywords

scanning electron microscopy, high-angle annular dark-field, HAADF, transmission scanning electron microscopy, t-SEM, SEM, STEM-in-SEM, aperture, transmission detector
Materials characterization

Citation

Holm, J. and Keller, R. (2016), Angularly-Selective Transmission Imaging in a Scanning Electron Microscope, Ultramicroscopy, [online], https://doi.org/10.1016/j.ultramic.2016.05.001 (Accessed October 11, 2025)

Issues

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Created May 5, 2016, Updated November 10, 2018
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