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Refined treatment of single-edge diffraction effects in radiometry
Published
Author(s)
Eric L. Shirley
Abstract
This work treats diffraction corrections in radiometry for cases of point and extended sources in symmetric three-element systems. It considers diffraction effects for both spectral power and total power in cases of Planckian sources. This improves upon an earlier work by simplifying the leading terms of asymptotic series, estimating remainder terms for asymptotic expansions, accelerating the treatment of extended sources and simplifying the calculation of diffraction effects over a range of wavelengths. We demonstrate the methodologys efficacy in two radiometric applications.
Citation
Journal of the Optical Society of America A-Optics Image Science and Vision
Shirley, E.
(2016),
Refined treatment of single-edge diffraction effects in radiometry, Journal of the Optical Society of America A-Optics Image Science and Vision, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920348
(Accessed October 10, 2025)