Journal of Research Volume 95

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Issue 1 January 1990

New program and directions at the National Institute of Standards and Technology, p. 1
Johnson, D.R.
http://dx.doi.org/10.6028/jres.095.002

Apparatus for simultaneous small-angle neutron scattering and steady shear viscosity studies of polymer melts and solutions, p. 7
Nakatani, A.I.; Kim, H.; Han, C.C.
http://dx.doi.org/10.6028/jres.095.003

Dynamics of the bell prover, II, p. 15
Ruegg, F.W.; Ruegg, F.C.
http://dx.doi.org/10.6028/jres.095.004

A proposed dynamic pressure and temperature primary standard, p. 33
Rosasco, G.J.; Bean, V.E.; Hurst, W.S.
http://dx.doi.org/10.6028/jres.095.005

Spectroradiometric determination of the freezing temperature of gold, p. 49
Mielenz, K.D.; Saunders, R.D.; Shumaker, J.B.
http://dx.doi.org/10.6028/jres.095.006

Special report on the International Temperature Scale of 1990 - Report on the 17Th Session of the Consultative Committee on thermometry, p. 69
Mangum, B.W.
http://dx.doi.org/10.6028/jres.095.007

New assignment of mass values and uncertainties to NIST working standards, p. 79
Davis, R.S.
http://dx.doi.org/10.6028/jres.095.008

Observation and an explanation of breakdown of the quantum Hall effect, p. 93
Cage, M.E.; Yu, D.Y.; Reedtz, G.M.
http://dx.doi.org/10.6028/jres.095.009

News briefs, p. 101
http://dx.doi.org/10.6028/jres.095.0010

Issue 2 March 1990

Radon measurement standards and calibration, Preface
Hutchinson, J.M.R.; Colle, R.
http://dx.doi.org/10.6028/jres.095.001

Calibration of Rn-222 reference instrument in Sweden, p. 115
Falk, R.; More, H.; Nyblom, L.
http://dx.doi.org/10.6028/jres.095.011

Bureau of Mines method of calibrating a primary radon measuring apparatus, p. 121
Holub, R.F.; Stroud, W.P.
http://dx.doi.org/10.6028/jres.095.012

A calibration and quality assurance program for environmental radon measurements, p. 127
Fisenne, I.M.; George, A.C.; Keller, H.W.
http://dx.doi.org/10.6028/jres.095.013

U.K. National Radiological Protection Board radon calibration procedures, p. 135
Cliff, K.D.
http://dx.doi.org/10.6028/jres.095.014

Enea reference atmosphere facility for testing radon and daughters measuring equipment, p. 139
Sciocchetti, G.; Scacco, F.; Tosti, S.; Baldassini, P.G.; Soldano, E.
http://dx.doi.org/10.6028/jres.095.015

Calibration of scintillation cells for radon-222 measurements at the U.S. Environmental Protection Agency, p. 143
Sensintaffar, E.L.; Windham, S.T.
http://dx.doi.org/10.6028/jres.095.016

ICARE radon calibration device, p. 147
Zettwoog, P.
http://dx.doi.org/10.6028/jres.095.017

The NIST primary radon-222 measurement system, p. 155
Colle, R; Hutchinson, J.M.R.; Unterweger, M.P.
http://dx.doi.org/10.6028/jres.095.018

The closed-can exhalation method for measuring radon, p. 167
Samuelsson, C.
http://dx.doi.org/10.6028/jres.095.019

Standarization of Rn-222 at the Australian Radiation Laboratory, p. 171
Gan, T.H.; Solomon, S.B.; Peggie, J.R.
http://dx.doi.org/10.6028/jres.095.020

Standardization of radon measurements: II. Accuracy and proficiency testing, p. 177
Matuszek, J.M.
http://dx.doi.org/10.6028/jres.095.021

Conference on Fifty Years With Nuclear Fission - Washington, DC and Gaithersburg, MD- April 25-28, 1989, p. 183
Wasson, O.A.
http://dx.doi.org/10.6028/jres.095.022

Twelfth National Computer Security Conference - Baltimore, MD - October 10-13, 1989, p. 189
Lennon, E.B.
http://dx.doi.org/10.6028/jres.095.023

Second International Conference on Chemical Kinetics - Gaithersburg, MD - July 24-27, 1989, p. 195
Herron, J.T.; Tsang, W.
http://dx.doi.org/10.6028/jres.095.024

News briefs, p. 199
http://dx.doi.org/10.6028/jres.095.025

Issue 3 May 1990

Operation of NIST Josephson array voltage standards, p. 219
Hamilton, C.A.; Burroughs, C.; Chieh, K.
http://dx.doi.org/10.6028/jres.095.026

The calibration of dc voltage standards at NIST, p. 237
Field, B.F.
http://dx.doi.org/10.6028/jres.095.027

NBS/NIST gas thermometry from 0°C to 660°C, p. 255
Schooley, J.F.
http://dx.doi.org/10.6028/jres.095.028

Phase equilibria and crystal chemistry in portions of the system SrO-CaO-Bi₂O₃-CuO, Part II - The system SrO-Bi₂O₃-CuO, p. 291
Roth, R.S.; Rawn, C.J.; Burton, B.P.; Beech, F.
http://dx.doi.org/10.6028/jres.095.029

Scattered light and other corrections in absorption coefficient measurements in the vacuum ultraviolet: A systems approach, p. 337
Klein, R.; Braun, W.; Fahr, A.; Mele, A.; Okabe, H.
http://dx.doi.org/10.6028/jres.095.030

Hypertext Standardization Workshop - Gaithersburg, MD - January 16-18, 1990, p. 345
Baronas, J.
http://dx.doi.org/10.6028/jres.095.031

Sixth International Conference on High Temperatures - Chemistry of Inorganic Materials - Gaithersburg, MD - April 3-7, 1989, p. 349
Baronas, J.
http://dx.doi.org/10.6028/jres.095.032

News briefs, p. 359
http://dx.doi.org/10.6028/jres.095.033

Issue 4 July 1990

Standards for waveform metrology based on digital techniques, p. 377
Bell, B.A.
http://dx.doi.org/10.6028/jres.095.034

The diffusion of charged particles in collisional plasmas: Free and ambipolar diffusion at low and moderate pressures, p. 407
Phelps, A.V.
http://dx.doi.org/10.6028/jres.095.035

Tables of the inverse Laplace transform of the function e -S-Beta, p. 433
Dishon, M.; Bendler, J.T.; Weiss, G.H.
http://dx.doi.org/10.6028/jres.095.036

International Conference on Narrow-Gap Semiconductors and Related Materials - Gaithersburg, MD - June 12-15, 1989, p. 469
Seiler, D.G.; Littler, C.L.
http://dx.doi.org/10.6028/jres.095.037

News briefs, p. 483
http://dx.doi.org/10.6028/jres.095.038

Issue 5 September 1990

Recommended values of the fundamental physical constants: A status report, p. 497
Taylor, B.N.; Cohen, E.R.
http://dx.doi.org/10.6028/jres.095.039

An international comparison of absolute radiant power measurement capabilities, p. 525
Thomas, D.B.
http://dx.doi.org/10.6028/jres.095.040

Results of a CIE detector response intercomparison, p. 533
Thomas, D.B.; Zalewski, F.
http://dx.doi.org/10.6028/jres.095.041

Effects of the International Temperature Scale of 1990 (ITS-90) on CIE documentary standards for radiometry, photometry, and colorimetry, p. 545
Mielenz, K.D.; Hsia, J.J.
http://dx.doi.org/10.6028/jres.095.042

An accurate value for the absorption coefficient of silicon at 633 nm, p. 549
Geist, J.; Schaefer, A.R.; Song, J.F.; Wang, Y.H.; Zalewski, E.F.
http://dx.doi.org/10.6028/jres.095.043

Hard x-ray microscope with submicrometer spatial resolution, p. 559
Kuriyama, M.; Dobbyn, R.C.; Spal, R.D.; Burdette, H.E.; Black, D.R.
http://dx.doi.org/10.6028/jres.095.044

Software techniques to improve data reliability in superconductor and low-resistance measurements, p. 575
Goodrich, L.F.; Srivastava, A.N.
http://dx.doi.org/10.6028/jres.095.045

Workshop on Intelligent Processing for Primary Metals - Gaithersburg, MD - August 29-30, 1989, p. 591
Early, J.G.
http://dx.doi.org/10.6028/jres.095.046

Data Administration Management Association Symposium - Gaithersburg, MD - May 7-8, 1990, p. 597
Newton, J.
http://dx.doi.org/10.6028/jres.095.047

Cimcon'90 Conference - Computer Integrated Manufacturing (CIM) Architecture Conference (CON) - Gaithersburg, MD - May 22-24, 1990, p. 601
Jones, A.
http://dx.doi.org/10.6028/jres.095.048

News briefs, p. 605
http://dx.doi.org/10.6028/jres.095.049

Issue 6 November 1990

The 1990 NIST scales of thermal radiometry, p. 621
Mielenz, K.D.; Saunders, R.D.; Parr, A.C.; Hsia, J.J.
http://dx.doi.org/10.6028/jres.095.050

Low-contrast thermal resolution test targets: A new approach, p. 631
Geist, J.; Novotny, D.B.
http://dx.doi.org/10.6028/jres.095.051

Analysis of the spectrum of doubly ionized molybdenum (Mo-III), p. 647
Iglesias, L.; Cabeza, M.I.; Kaufman, V.
http://dx.doi.org/10.6028/jres.095.052

Survey of industrial, agricultural, and medical applications of radiometric gauging and process control, p. 689
Hubbell, J.H.
http://dx.doi.org/10.6028/jres.095.053

Vapor-liquid equilibrium of carbon dioxide with isobutane and n-butane: Modified leung-griffiths correlation and data evaluation, p. 701
Rainwater, J.C.; Ingham, H.; Lynch, J.J.
http://dx.doi.org/10.6028/jres.095.054

Fiftieth Annual Conference on Physical Electronics - Gaithersburg, MD - June 11-13, 1990, p. 719
Cavanagh, R.
http://dx.doi.org/10.6028/jres.095.055

North American Integrated Services Digital Network (ISDN) Users' Forum (NIU-Forum) - Gaithersburg, MD -August 6-9, 1990, p. 723
Lennon, E.B.
http://dx.doi.org/10.6028/jres.095.056

News briefs, p. 725
http://dx.doi.org/10.6028/jres.095.057