The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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Volume 104 | ISSN: 1044-677X |
Issue 1 | Issue 2 |
Issue 3 | Issue 4 |
Issue 5 | Issue 6 |
Tests of a Two-Photon Technique for Measuring Polarization Mode Dispersion With Subfemtosecond Precision , p. 1
Eric Dauler, Gregg Jaeger, Antoine Muller, A. Migdall, and A. Sergienko
http://dx.doi.org/10.6028/jres.104.001
Thermodynamic Temperatures of the Triple Points of Mercury and Gallium and in the Interval 217 K to 303 K , p. 11
M. R. Moldover, S. J. Boyes, C. W. Meyer, and A. R. H. Goodwin
http://dx.doi.org/10.6028/jres.104.002
Trilateral Intercomparison of Photometric Units Maintained at NIST (USA), NPL (UK), and PTB (Germany) , p. 47
Yoshi Ohno, Teresa Goodman, and Georg Sauter
http://dx.doi.org/10.6028/jres.104.003
The NIST Quantitative Infrared Database , p. 59
P. M. Chu, F. R. Guenther, G. C. Rhoderick, and W. J. Lafferty
http://dx.doi.org/10.6028/jres.104.004
Toward a National Standards Strategy to Meet Global Needs , p. 83
Walter G. Leight and Krista Johnsen Leuteritz
http://dx.doi.org/10.6028/jres.104.005
Overview of the Federal Technical Standards Conference , p. 91
Krista Johnsen Leuteritz
http://dx.doi.org/10.6028/jres.104.006
First Advanced Encryption Standard (AES) Candidate Conference , p. 97
Edward Roback and Morris Dworkin
http://dx.doi.org/10.6028/jres.104.007
Comparison of the NIST and BIPM Air-Kerma Standards for Measurements in the Low-Energy X-Ray Range , p. 135
D. T. Burns, P. Lamperti, and M. O'Brien
http://dx.doi.org/10.6028/jres.104.009
Validation of New Instrumentation for Isotope Dilution Mass Spectrometric Determination of Organic Serum Analytes , p. 141
P. Ellerbe, C. S. Phinney, L. T. Sniegoski, and M. J. Welch
http://dx.doi.org/10.6028/jres.104.010
Crystal Structures and Reference Powder Patterns of BaR2ZnO5(R = La, Nd, Sm, Eu, Gd, Dy, Ho, Y, Er, and Tm) , p. 147
J. A. Kaduk, W. Wong-Ng, W. Greenwood, J. Dillingham, and B. H. Toby
http://dx.doi.org/10.6028/jres.104.011
Estimation of Concentration and Bonding Environment of Water Dissolved in Common Solvents Using Near Infrared Absorptivity , p. 173
Brian Dickens and Sabine H. Dickens
http://dx.doi.org/10.6028/jres.104.012
Near Infrared 45°/0° Reflectance Factor of Pressed Polytetrafluoroethylene (PTFE) Powder , p. 185
Maria E. Nadal and P. Yvonne Barnes
http://dx.doi.org/10.6028/jres.104.013
A Fast Method of Transforming Relaxation Functions Into the Frequency Domain , p. 189
Frederick I. Mopsik
http://dx.doi.org/10.6028/jres.104.014
Manufacturer's CORBA Interface Testing Toolkit: Overview , p. 193
David Flater
http://dx.doi.org/10.6028/jres.104.015
The NIST Length Scale Interferometer , p. 225
John S. Beers and William B. Penzes
http://dx.doi.org/10.6028/jres.104.017
Vacuum Processing Technique for Development of Primary Standard Blackbodies , p. 253
M. Navaro, S. S. Bruce, B. Carol Johnson, A. V. Murthy, and R. D. Saunders
http://dx.doi.org/10.6028/jres.104.018
Small Angle Neutron Scattering by the Magnetic Microstructure of Nanocrystalline Ferromagnets Near Saturation , p. 261
J. Weissmüller, R. D. McMichael, A. Michels, and R. D. Shull
http://dx.doi.org/10.6028/jres.104.019
Primary Phase Field of the Pb-Doped 2223 High-Tc Superconductor in the (Bi, Pb)-Sr-Ca-Cu-O System , p. 277
W. Wong-Ng, L. P. Cook, A. Kearsley, and W. Greenwood
http://dx.doi.org/10.6028/jres.104.020
Electronic Commerce of Component Information Workshop , p. 291
James A. St. Pierre, Curtis H. Parks, and Ronald Waxman
http://dx.doi.org/10.6028/jres.104.021
Analyzing the Effects of Capacitances-to-Shield in Sample Probes on AC Quantized Hall Resistance Measurements , p. 323
M. E. Cage and A. Jeffery
http://dx.doi.org/10.6028/jres.104.023
A Conceptual Data Model of Datum Systems , p. 349
Michael R. McCaleb
http://dx.doi.org/10.6028/jres.104.024
Second Advanced Encryption Standard Candidate Conference , p. 401
Morris Dworkin
http://dx.doi.org/10.6028/jres.104.025
Status Report on the First Round of the Development of the Advanced Encryption Standard , p. 435
James Nechvatal, Elaine Barker, Donna Dodson, Morris Dworkin, James Foti, and Edward Roback
http://dx.doi.org/10.6028/jres.104.027
Measurement of the Rheological Properties of High Performance Concrete: State of the Art Report , p. 461
Chiara F. Ferraris
http://dx.doi.org/10.6028/jres.104.028
On the Diffraction Limit for Lensless Imaging , p. 479
Klaus D. Mielenz
http://dx.doi.org/10.6028/jres.104.029
Comparative Calibration of Heat Flux Sensors in Two Blackbody Facilities , p. 487
A. V. Murthy, B. K. Tsai, and R. D. Saunders
http://dx.doi.org/10.6028/jres.104.030
Second Process Specification Language (PSL) Roundtable , p. 495
Craig Schlenoff
http://dx.doi.org/10.6028/jres.104.031
Equivalent Electrical Circuit Representations of AC Quantized Hall Resistance Standards , p. 529
M. E. Cage, A. Jeffery, and J. Matthews
http://dx.doi.org/10.6028/jres.104.033
Performance Verification of Impact Machines for Testing Plastics , p. 557
T. A. Siewert, D. P. Vigliotti, L. B. Dirling, and C. N. McCowan
http://dx.doi.org/10.6028/jres.104.034
Applicability of Metrology to Information Technology , p. 567
Martha M. Gray
http://dx.doi.org/10.6028/jres.104.035
Formulation of Multiple Diffraction by Trees and Buildings for Radio Propagation Predictions for Local Multipoint Distibution Service , p. 579
Wei Zhang
http://dx.doi.org/10.6028/jres.104.036
Dynamic Power-Conscious Routing for MANETs: An Initial Approach , p. 587
Madhavi W. Subbarao
http://dx.doi.org/10.6028/jres.104.037