The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
For additional information see: About the Journal
Volume 100 | ISSN: 1044-677X |
Issue 1 | Issue 2 |
Issue 3 | Issue 4 |
Issue 5 | Issue 6 |
Preparation and Calibration of Carrier-Free 209Po Solution Standards , p. 1
R. Collé, Zhichao Lin, F. J. Schima, P. A. Hodge, J. W. L. Thomas, J. M. R. Hutchinson, and B. M. Coursey
http://dx.doi.org/10.6028/jres.100.002
Spectral Radiance of a Large-Area Integtrating Sphere Source , p. 37
James H. Walker and Ambler Thompson
http://dx.doi.org/10.6028/jres.100.003
Deposition of Diamond Films in a Closed Hot Filament CVD System , p. 43
Guan-Ren Lai, E. N. Farabaugh, A. Feldman, and L. H. Robins
http://dx.doi.org/10.6028/jres.100.004
Variances in the Measurement of Ceramic Powder Properties , p. 51
R. G. Munro, S. G. Malghan, and S. M. Hsu
http://dx.doi.org/10.6028/jres.100.005
On the Applications of Discontinuous Bessel Integrals to Chronoamperometry , p. 61
William T. Yap, and Richard A. Durst
http://dx.doi.org/10.6028/jres.100.006
Third International Conference on Information and Knowledge Management (CIKM-94) , p. 67
Elizabeth Fong, Shirley Hurwitz, and Yelena Yesha
http://dx.doi.org/10.6028/jres.100.007
Federal Wireless Users' Forum Workshop , p. 71
Mary K. Ruhl and Tish Antonishek
http://dx.doi.org/10.6028/jres.100.008
Workshop on Water: Its Measurement and Control in Vacuum , p. 75
Stuart A. Tison and J. Patrick Looney
http://dx.doi.org/10.6028/jres.100.009
Manufacturing Technology Conference: Toward a Common Agenda , p. 83
Joseph Hungate
http://dx.doi.org/10.6028/jres.100.010
News Briefs , p. 93
http://dx.doi.org/10.6028/jres.100.011
Low-Temperature Properties of Silver , p. 119
David R. Smith and F. R. Fickett
http://dx.doi.org/10.6028/jres.100.012
Mixing Plate-Like and Rod-Like Molecules With Solvent: A Test of Flory-Huggins Lattice Statistics , p. 173
Edmund A. Di Marzio, Arthur J. M. Yang, and Sharon C. Glotzer
http://dx.doi.org/10.6028/jres.100.013
News Briefs , p. 187
http://dx.doi.org/10.6028/jres.100.014
Determining the Magnetic Properties of 1 kg Mass Standards , p. 209
Richard S. Davis
http://dx.doi.org/10.6028/jres.100.015
1993 Intercomparison of Photometric Units Maintained at NIST (USA) and PTB (Germany) , p. 227
Yoshihiro Ohno and Georg Sauter
http://dx.doi.org/10.6028/jres.100.016
Determination of the Transmittance Uniformity of Optical Filter Standard Reference Materials , p. 241
J. C. Travis, N. K. Winchester, and M. V. Smith
http://dx.doi.org/10.6028/jres.100.017
Low-Frequency Model for Radio-Frequency Absorbers , p. 257
J. Randa
http://dx.doi.org/10.6028/jres.100.018
Using Quantized Breakdown Voltage Signals to Determine the Maximum Electric Fields in a Quantum Hall Effet Sample , p. 269
M. E. Cage and C. F. Lavine
http://dx.doi.org/10.6028/jres.100.019
High Accuracy Measurement of Aperture Area Relative to a Standard Known Aperture , p. 277
Joel B. Fowler and Gyula Dezsi
http://dx.doi.org/10.6028/jres.100.020
Letter to the Editor New IUPAC guidelines for the reporting of stable hydrogen, carbon, and oxygen isotope-ratio data , p. 285
Tyler B. Coplen
http://dx.doi.org/10.6028/jres.100.021
Quest for Excellence VII- Conference Report , p. 287
Cap Frank and Robert E. Chapman
http://dx.doi.org/10.6028/jres.100.022
17th National Computer Security Conference- Conference Report , p. 301
Dennis Gilbert
http://dx.doi.org/10.6028/jres.100.023
News Briefs , p. 311
http://dx.doi.org/10.6028/jres.100.024
Front Cover–Title Page–Contents
http://dx.doi.org/10.6028/jres.100.001
The Gaseous Electronics Conference RF Reference Cell–An Introduction , p. 327
J. K. Olthoff and K. E. Greenberg
http://dx.doi.org/10.6028/jres.100.025
Current and Voltage Measurements in the Gaseous Electronics Conference RF Reference Cell , p. 341
Mark A. Sobolewski
http://dx.doi.org/10.6028/jres.100.026
Optical Emission Spectroscopy on the Gaseous Electronics Conference RF Reference Cell , p. 353
J. R. Roberts
http://dx.doi.org/10.6028/jres.100.027
Optical Diagnostics in the Gaseous Electronics Conference RF Reference Cell , p. 373
G. A. Hebner and Kenneth E. Greenberg
http://dx.doi.org/10.6028/jres.100.028
Studies of Ion Kinetic-Energy Distributions in the Gaseous Electronics Conference RF Reference Cell , p. 383
J. K. Olthoff, R. J. Van Brunt, and S. B. Radovanov
http://dx.doi.org/10.6028/jres.100.029
Microwave Diagnostic Results from the Gaseous Electronics Conference RF Reference Cell , p. 401
Lawrence J. Overzet
http://dx.doi.org/10.6028/jres.100.030
Langmuir Probe Measurements in the Gaseous Electronics Conference RF Reference Cell , p. 415
M. B. Hopkins
http://dx.doi.org/10.6028/jres.100.031
An Inductively Coupled Plasma Source for the Gaseous Electronics Conference RF Reference Cell , p. 427
Paul A. Miller, Gregory A. Hebner, Kenneth E. Greenberg, Paul D. Pochan, and Ben P. Aragon
http://dx.doi.org/10.6028/jres.100.032
Reactive Ion Etching in the Gaseous Electronics Conference RF Reference Cell , p. 441
M. L. Brake, J. T. P. Pender, M. J. Buie, A. Ricci, J. Soniker, P. D. Pochan, and P. A. Miller
http://dx.doi.org/10.6028/jres.100.033
Dusty Plasma Studies in the Gaseous Electronics Conference RF Reference Cell , p. 449
H. M. Anderson and S. B. Radovanov
http://dx.doi.org/10.6028/jres.100.034
One-Dimensional Modeling Studies of the Gaseous Electronics Conference RF Reference Cell , p. 463
T. R. Govidan and M. Meyyappan
http://dx.doi.org/10.6028/jres.100.035
Two-Dimensional Self-Consistent Radio Frequency Plasma Simulations Relevant to the Gaseous Electronics Conference RF Reference Cell , p. 473
Dimitris P. Lymberopoulos and Demetre J. Economou
http://dx.doi.org/10.6028/jres.100.036
Forty-Seventh Annual Gaseous Electronics Conference- Conference Report , p. 495
Richard J. Van Brunt and Jean W. Gallagher
http://dx.doi.org/10.6028/jres.100.037
News Briefs , p. 501
http://dx.doi.org/10.6028/jres.100.038
Low Electrolytic Conductivity Standards , p. 521
Yung Chi Wu and Paula A. Berezansky
http://dx.doi.org/10.6028/jres.100.039
Potential and Current Distributions Calculated Across a Quantum Hall Effet Sample at Low and High Currents , p. 529
M. E. Cage and C. F. Lavine
http://dx.doi.org/10.6028/jres.100.040
Microform Calibration Uncertainties of Rockwell Diamond Indenters , p. 543
J. F. Song, F. F. Rudder, Jr., T. V. Vorburger, and J. H. Smith
http://dx.doi.org/10.6028/jres.100.041
Performance Measures for Geometric Fitting in the NIST Algorithm Testing and Evaluation Program for Coordinate Measurement Systems , p. 563
Theodore H. Hopp and Mark S. Levenson
http://dx.doi.org/10.6028/jres.100.042
A Study on the Reuse of Plastic Concrete Using Extended Set-Retarding Admixtures , p. 575
Colin Lobo, William F. Guthrie, and Raghu Kacker
http://dx.doi.org/10.6028/jres.100.043
A Third Generation Water Bath Based Blackbody Source , p. 591
Joel B. Fowler
http://dx.doi.org/10.6028/jres.100.044
COMPASS '95 Tenth Annual Conference on Computer Assurance- Conference Report , p. 601
Bonnie P. Danner, Laura M. Ippolito, and Dolores R. Wallace
http://dx.doi.org/10.6028/jres.100.045
News Briefs , p. 607
http://dx.doi.org/10.6028/jres.100.046
Calibration of Electret-Based Integral Radon Monitors Using NIST Polyethylene-Encapsulated 226Ra/222Rn Emanation (PERE) Standards , p. 629
R. Collé, P. Kotrappa, and J. M. R. Hutchinson
http://dx.doi.org/10.6028/jres.100.047
Microstructural Characterization of Cobalt-Tungsten Coated Graphite Fibers , p. 641
N. S. Wheeler
http://dx.doi.org/10.6028/jres.100.048
On Using Collocation in Three Dimensions and Solving a Model Semiconductor Problem , p. 661
J. F. Marchiando
http://dx.doi.org/10.6028/jres.100.049
Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series Connections , p. 677
A. Jeffery, R. E. Elmquist, and M. E. Cage
http://dx.doi.org/10.6028/jres.100.050
Analysis of the (5d2+5d6s)-5d6p Transition Arrays of Os VII and Ir VIII, and the 6s 2S-6p 2P Transitions of Ir IX , p. 687
G. J. van het Hof, Y. N. Joshi, J. F. Wyart, and J. Sugar
http://dx.doi.org/10.6028/jres.100.051
Application Portability Profile and Open System Environment User's Forum- Conference Report , p. 699
Joseph I. Hungate, Martha M. Gray, and Kathleen A. Liburdy
http://dx.doi.org/10.6028/jres.100.052
International Workshop on Semiconductor Characterization: Present Status and Future Needs- Conference Report , p. 711
D. G. Seiler and T. J. Shaffner
http://dx.doi.org/10.6028/jres.100.053
Metrology Issues in Terahertz Physics and Technology- Conference Report , p. 717
Raju Datla, Erich Grossman, and Mitchell K. Hobish
http://dx.doi.org/10.6028/jres.100.054
News Briefs , p. 725
http://dx.doi.org/10.6028/jres.100.055