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Researchers at the National Institute of Standards and Technology (NIST) have developed a laser-based instrument that generates artificial sunlight to help test
In response to requests from the semiconductor industry,* a team of PML researchers has demonstrated that atomic force microscope (AFM) probe tips made from its
Angela Hight Walker of PML's Semiconductor and Dimensional Metrology Division and colleagues have succeeded in measuring a previously unknown but essential
Researchers at the National Institute of Standards and Technology (NIST), working in collaboration with the Naval Research Laboratory, have found that a
A chip-scale device that both produces and detects a specialized gas used in biomedical analysis and medical imaging has been built and demonstrated at the
Crowding has notoriously negative effects at large size scales, blamed for everything from human disease and depression to community resource shortages. But
The theme of this year's World Metrology Day, " Measurements and the Global Energy Challenge," speaks to one of the defining issues of our time. One that is as
By employing a technique analogous to the operation of noise-canceling headphones, PML researchers have created an exquisitely sensitive, semiconductor-based
Microscopes don't exactly lie, but their limitations affect the truths they can tell. For example, when operated in their most typical high-energy modes
Nerve agents are among the world's most feared chemical weapons, but scientists at the National Institute of Standards and Technology (NIST) have demonstrated a
Yoshi Ohno, a group leader in PML's Sensor Science Division, was recently honored by the Department of Energy as the first recipient of the SSL Visionary Award
When the semiconductor industry received the eagerly awaited annual update of the International Technology Roadmap for Semiconductors (ITRS) [1] at the end of
In a truly scintillating set of experiments, scientists at NIST and the University of Maryland have demonstrated that a process called excimer* scintillation
Researchers from the NIST Center for Nanoscale Science and Technology (CNST) have observed electromagnetically induced transparency at room temperature and
JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability
PML researchers have developed a novel method of fabricating graphene-based microdevices that may hasten the arrival of a new generation of standards for
NIST-F2 Atomic Clock News Briefing: Opening Statement by Tom O'Brian, Chief, Time and Frequency Division Opening Statement by Steve Jefferts, NIST Project
In an article appearing in the March 28th issue of Physical Review Letters, researchers from Northwestern University working with researchers from the NIST
Researchers at the National Institute of Standards and Technology (NIST) have rejuvenated a technique for finding planets near distant stars.* New measurements
Very soon, the International System of Units (SI) may be revised to define the unit of mass in terms of a fixed value of the Planck constant, h. That move would
PML researchers have devised an idea for determining the three-dimensional shape of features as small as 10 nanometers wide. The model-based method compares
There are many unknowns in the future of computing. But one thing is certain: Devices will be reading and writing information faster, and storing it at ever
Researchers from the NIST Center for Nanoscale Science and Technology (CNST), in collaboration with researchers from University of Lyon, France, have applied a