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Roadmapping In-Situ Metrology for Metal Alloy Additive Manufacturing

Roadmapping In-Situ Metrology for Metal Alloy Additive Manufacturing
Credit: NIST/Fan Zhang

Metal-based additive manufacturing (AM) has the potential to transform critical industries including aerospace, defense, energy, and medical devices. However, widespread adoption remains limited by challenges in process understanding, qualification, and certification. A key barrier is the lack of reliable and validated in situ measurements capable of monitoring structural and microstructural evolution during AM processes.

In situ metrology enables real-time observation of thermal, structural, and material phenomena during metal AM fabrication, providing critical data to link process conditions with material structure and performance. This workshop will emphasize structural measurements during fabrication and processing, including measurements of phase evolution, microstructure development, and residual stress—information essential for model validation and process qualification.

This NIST workshop will bring together stakeholders from industry, academia, government, and national laboratories to identify key measurement science gaps and develop a community-informed roadmap for advancing in situ metrology in metal additive manufacturing. Outcomes will inform a NIST Special Publication outlining research priorities across metrology, data, artificial intelligence, and standards to support qualification-ready manufacturing and accelerate industrial adoption.

April 29, 2026 - 8:00am - May 1, 2026 12:30pm ET

Check back for updates

 

A hotel block has been reserved at the following location:

Holiday Inn Gaithersburg

Two Montgomery Village Ave, Gaithersburg, MD 20879

Rate: $115 per night, excluding taxes and fees.  Rate includes complimentary breakfast each day and shuttle.

 Click here to book your room: Road Mapping In Situ Metrology for Advanced Manufacturing Workshop Booking Link   Last day to register is April 15, 2026.

Visitor Access Requirement:

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*Use of apps, physical photocopies, and/or digital screenshots of your ID, Passport or Green card will not be accepted. 

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For more information please visit our Campus Access and Security page.

Created January 29, 2026, Updated March 19, 2026
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