Introducing the new CHIPS Metrology Community for advancing metrology for semiconductors and microelectronics. Hear how we’ll work to advance breakthrough measurements that are accurate, precise, and fit-for-purpose to produce microelectronic materials, devices, circuits, and systems, and learn about future engagement opportunities for industry and academia to identify relevant metrology problems; share key research and knowledge; and develop practical solutions together through the community.
Additional speakers include Rebecca Rouston and Isvar Cordova