As a follow-on to the National Academies of Science, Engineering, and Medicine workshop on Assessing and Improving AI Trustworthiness and the National Institute of Standards and Technology (NIST) workshop on AI Measurement and Evaluation, NIST has begun hosting a bi-weekly AI metrology colloquia series, where leading researchers share current and recent work in AI measurement and evaluation.
This series provide a dedicated venue for the presentation and discussion of AI metrology research and to spur collaboration among AI metrology researchers in order to help advance the state-of-the-art in AI measurement and evaluation. The series is open to the public and the presentation formats are flexible, though generally consist of 50-minute talks with 10 minutes of questions and discussion.
Please contact aime [at] nist.gov (aime[at]nist[dot]gov) with any questions, or to join the AIME mailing list.
For information on past and upcoming seminars, click here.