Registration ends on 8/9/2017 at 11:45 PM EDT
The sixth International Conference on Tip-Enhanced Raman Spectroscopy (TERS-6) brings together government, academic and industrial researchers interested in the latest measurement developments in this complex and exciting field.
The meeting addresses both the fundamentals and the applications of TERS, with special emphasis on spatial resolution, enhancement, improvements in reliability, comparability, robustness and methodology. The scientific program will include invited and contributed talks, industry presentations and training sessions, and poster sessions.
The TERS series began at the National Physical Laboratory (NPL) in the UK 2009, and since then it has been gathering a growing number of scientists from around the world. The last meeting TERS-5 was held in Japan.
TERS-6 will be held just outside Washington DC at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD USA. The timing (August 16-18th, 2017) of TERS-6 is such that it will be the week before the 254th National ACS Meeting in Washington, DC (August 20-24th, 2017).
Rick Van Duyne
Northwestern University, USA
Max Planck Institute for Polymer Research, Germany
University of California, Irvine, USA
Xiamen University, China
Markus B. Raschke
University of Colorado, USA
University of North Carolina at Chapel Hill, USA
Swiss Federal Institute of Technology (ETH) Zurich, Switzerland