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Sixth International Conference on Tip-Enhanced Raman Spectroscopy (TERS-6)

TERS-6 logo

The sixth International Conference on Tip-Enhanced Raman Spectroscopy (TERS-6) brings together government, academic and industrial researchers interested in the latest measurement developments in this complex and exciting field.

The meeting addresses both the fundamentals and the applications of TERS, with special emphasis on spatial resolution, enhancement, improvements in reliability, comparability, robustness and methodology. The scientific program will include invited and contributed talks, industry presentations and training sessions, and poster sessions.

The TERS series began at the National Physical Laboratory (NPL) in the UK 2009, and since then it has been gathering a growing number of scientists from around the world.  The last meeting TERS-5 was held in Japan.

TERS-6 will be held just outside Washington DC at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD USA.  The timing (August 16-18, 2017) of TERS-6 is such that it will be the week before the 254th National ACS Meeting in Washington, DC (August 20-24, 2017).

Conference Chairs:

  • angela.hightwalker [at] nist.gov (Angela R. Hight Walker)
  • zschultz [at] nd.edu (Zachary Shultz)
  • vanduyne [at] northwestern.edu (Richard Van Duyne)
  • pjschuck [at] lbl.gov (P. James Schuck)

Printable version of agenda (PDF)

TimeInvited/
Contributed
SpeakerTalk (links go to PDF documents)
Wednesday August 16, 2017
8 am - 11 amExhibitor set-up and Registration
10:00 amBus leaves hotel for NIST
11:00 amWelcome
11:15 amInvitedRick Van Duyne, USANanoscale Chemical Imaging with UHV and EC-TERS
11:50 amContributedThiago L. Vasconcelos, BrazilOptically Tunable Tip Pyramids for TERS
12:10 pmContributedDamien Eschimese, FranceHigh Performance Micro/Nanofabricated AFM-TERS Probes based on a Metallic Nanocone/Nanodisk Integrated on a Silicon Cantilever
12:30 pmLunch/Posters/Exhibits
1:45 pmInvitedLasse Jensen, USASingle Molecule Imaging Using Atomistic Near-Field TERS
2:20 pmContributedChahinez Dab, CanadaTip-Enhanced Hyper-Raman Spectroscopy (TEHRS) for Nanoelectronics
2:40 pmContributedAndrea Centrone, USAPhotothermal Induced Resonance, A Novel AFM Method to Measure IR Chemical Composition, Band Gap and Thermal Conductivity at the Nanoscale
3:10 pmBreak/Posters/Exhibits
3:45 pmInvitedBin Ren, ChinaTERS for Nanoscale Characterization of Surface Reaction and Dynamics
4:20 pmContributedEmanuele Poliani, GermanyTERS of Isotopically Engineered 12C/13C Graphene Super Lattices and Channels
4:40 pmContributedChanwoo Lee, KoreaRevealing Defect-Related Raman Mode of Monolayer WS2 via Resonant TERS
5:00 pmContributedJacek Szcerbinski, SwitzerlandUnderstanding Photodamage in Plasmonic Hot Spots
5:20 pmPosters/Exhibits/Beer/hors d'oeuvre - Thank you Sponsors!
6:50 pmBus to hotel
Thursday August 17, 2017
8:15 amBus leaves Hotel
9:00 amInvitedRenato Zenobi, Switzerland2-Dimensional Polymers Studied by TERS
9:35 amContributedAndrea Rossi, ItalyOrganic Patterned Samples by Electron Beam for Gap-Mode STM TERS and Chemical Imaging
9:55 amContributedThomas P. Darlington, USAIntra-Bubble Strain Texture Controls Nanoscale Localization of Defect-Bound Excitons in Monolayer WSe2 at Room Temperature
10:25 amBreak
11:00 amInvitedJoanne Atkin, USASemiconducting Nanostructures for Mid-Infrared Plasmon-Enhanced Spectroscopy
11:35 amContributedSergey S. Kharintsev, RussiaPlasmon-Enhanced Stimulated Raman Scattering with Refractory Titanium Nitride Nano-Stripes
11:55 amContributedAndrey Krayev, USAGrain Boundaries and Nanoscale Heterogeneities in Monolayer MoSe2 Revealed by Correlated SPM and TERS
12:25 pmLunch/Posters/Exhibits
1:30 pmContributedXu Chen, USAElectrochemical TERS: In Situ Mechanistic Studies
1:50 pmContributedT. Touzallin, FranceComplex Electron Transfer Pathway at a Microelectrode Captured by in situ Nanospectroscopy
2:20 pmContributedPrabhat Verna, JapanNano-Light-Source for Background-Free TERS
2:40 pmContributedDerek Nowak, USANanoscale Strain Mapping via Photo-Induced Force Microscopy (PiFM)
3:10 pmCompany Intros
3:45 pmBreak/Posters/Exhibits - Running of Samples!
5:45 pmBus leaves for Hotel
6:30 pmConference Dinner @ Hotel - Sponsored by Horiba
Friday August 18, 2017
8:15 amBus leaves Hotel
9:00 amInvitedMarkus B. Raschke, USAMultimodal Tip-Enhanced Spectroscopy
9:35 amContributedDmitri Voronine, USATERS of 2D Materials in the Quantum Limit
9:55 amContributedErin Wood, USAA Systematic Evaluation of Lithographically Printed Strained Si Test Structures
10:15 amContributedDario Imbraguglio, ItalyInvestigations on the Use of Thin Adhesion Layers in Top-Illumination AFM TERS
10:35 amBreak
11:15 amInvitedKatrin Domke, GermanyElectrochemical TERS elucidates potential-induced molecular reorientation and chemical conversion
11:50 amContributedMichael Mattei, USAInvestigating Site-Specific Electrochemistry with TERS
12:10 pmContributedHai-Sheng Su, ChinaProbing the Electronic Properties of Pt-Au Bimetallic Catalyst by Tip-Enhanced Raman Spectroscopy
12:30 pmInvitedEric Potma, USASurface-Enhanced Coherent Anti-Stokes Raman Scattering
1:05 pmLunch/Posters/Exhibits
2:15 pmWrap up
2:30 pm - 6:00 pmExhibits and Running Samples
6:00 pmBus to hotel

* Agenda subject to change

Rick Van Duyne

Northwestern University, USA

Rick Van Duyne

Katrin Domke

Max Planck Institute for Polymer Research, Germany

Katrin Domke

Eric Potma

University of California, Irvine, USA

Eric Potma

Bin Ren

Xiamen University, China

Bin Ren

Markus B. Raschke

University of Colorado, USA

Markus Raschke

Joanne Atkin

University of North Carolina at Chapel Hill, USA

Joanne Atkin

Renato Zenobi

Swiss Federal Institute of Technology (ETH) Zurich, Switzerland

Renato Zenobi

Lasse Jensen

The Pennsylvania State University, USA

Lasse Jensen

 

Courtyard by Marriott - $131 per night. That includes a hot breakfast and transportation to/from NIST. The block is under the name “NIST TERS Meeting.”

Created January 23, 2017, Updated August 16, 2017