The emergence of transmission approaches to imaging and diffraction within the scanning electron microscope (SEM) has opened the door to a new realm of characterization that both extends established limits of conventional SEM and complements the strengths of the transmission electron microscope (TEM).
This workshop seeks to:
The meeting will include:
Attendees are invited to present a brief (~ 1-2 minutes) oral summary/poster preview of their work on transmission SEM and/or related technologies; display a poster on their research; and to actively participate in the discussions in each of our sessions.
The final output will be a publicly-available NIST Special Publication summarizing the workshop findings. We will also discuss strategies during the meeting for other forms of dissemination by key attendees.
ABSTRACT DEADLINE EXTENDED TO WEDNESDAY, 2 SEPTEMBER 2015.
We have a limited number of slots for poster presenters covering ANY aspects of SEM-based transmission technique application and/or development. Prospective poster presenters should submit a 1-page abstract electronically in PDF format to Bob Keller, adhering to the guidelines below:
Agenda PDF (updated 9/9)
Tuesday,15 September, 2015
7:45 AM– Millennium Harvest House Hotel guests board shuttle to NIST
8:00 AM- 9:00 AM Check-in at NIST Visitor Center and Continental Breakfast in meeting room (photo ID required for entrance to NIST site)
9:00 AM Workshop Welcome - Bob Keller, NIST
9:15 AM Keynote – STEM: It has all been done before! (well maybe not everything) - Joseph Michael, Sandia National Laboratory
10:15 AM Coffee/Poster Setup
Session II: Diffraction
10:45 AM: Nanomaterials characterization using transmission Kikuchidiffraction: a breakthrough or a curiosity? - Patrick Trimby, University of Sydney
11:45 AM Electron Imaging using an EBSD Detector – Applications for Reflection and Transmission EBSD Geometries - Matt Nowell, EDAX/Ametek
12:45 PM Lunch in meeting room/Brief NIST Welcome - Jim Fekete, NIST Applied Chemicals & Materials Division Chief
1:45 PM Diffraction Discussion Session
2:30 PM Poster Introductions (up to 4 minutes each)
3:15 PM Coffee/Poster Session
Session III: Imaging
3:45 PM Transmission diffraction, spectroscopy, imaging in the SEM -Raynald Gauvin, McGill University
4:45 PM From Bragg Diffraction to HAADF Imaging: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector- Jason Holm, NIST
5:45 PM Imaging Discussion
6:30 PM End of Day 1 – Millennium Harvest House guests board shuttle to hotel
7:00 PM Plenary speaker group dinner at Zolo Southwestern Grill in Boulder – reservation made for 10 people
Wednesday,16 September, 2015
7:45 AM – Millennium Harvest House Hotel guests board shuttle to NIST
8:00 AM Continental Breakfast in meeting room
8:15 AM Housekeeping
Session IV: Spectroscopy
8:30 AM Silicon Drift Detector Energy Dispersive X-ray Spectrometry(SDD-EDS): A Transformative Technology for Electron-Excited Elemental Analysis- Nicholas Ritchie, NIST
9:30 AM EELS in the SEM - Ray Twesten, Gatan
10:30 AM Coffee/Poster Session
11:00 AM Spectroscopy Discussion Session
11:45 AM Lunch in meeting room
Session V:Complementary Technologies
12:45 PM Application of Low Voltage Electron Microscopy for New Science and Materials - David Bell, Harvard University
1:45 PM Transmission Imaging with a Focused Helium Ion Beam - John Notte, Carl Zeiss
2:45 PM Coffee/Poster Session
3:15 PM Tour of the NIST Precision Imaging Facility (AC-TEM, FIB,HIM, APT) – Aric Sanders, NIST
Session VI: Roadmapping and Collaboration
4:15 PM Summary Discussions of the Future of Transmission SEM, Routes for Strategic Collaboration
5:45 PM Closing Remarks and Departure
6:00 PM Meeting ends
If you are not registered, you will not be allowed on site. Registered attendees will receive security and campus instructions prior to the workshop.
NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays (up to 24 hours) in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12. When registration is open, the required NIST-1260 form will be available as well.
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