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Brookhaven National Laboratory

In partnership with Brookhaven National Laboratory, NIST is developing, building, and operating a suite of world-leading X-ray measurements of materials structure and chemistry with sensitivity to every element in the periodic table at the new National Synchrotron Light Source II in Upton, NY

Permanently stationed on the campus of Brookhaven National Laboratory (BNL) in Upton, NY, the NIST Synchrotron Science Group continues a 30+ year partnership with the Department of Energy (DoE) and BNL to design, build, and operate state-of-the-art X-ray beamlines dedicated to probing critical questions in materials science and manufacturing. In its newest phase, the partnership allows NIST to leverage a unique, high-powered X-ray source at the newly built National Synchrotron Light Source II (NSLS-II), while BNL receives access to both NIST expertise in X-ray measurement technology and a strong manufacturing customer base built on the extensive NIST network of partnerships.  

The NIST Group Leader, Daniel Fischer, is permanently stationed at NSLS-II and oversees  NIST staff members dedicated to building and operating these facilities, both for NIST and BNL staff members, and users who gain access through the BNL user proposal system. The NIST beamline suite is comprised of three state-of-the-art high-throughput beamlines with spectroscopy and diffraction capabilities: Spectroscopy Soft and Tender (SST-1, SST-2) and Beamline for Materials Measurement (BMM). Taken together, the NIST Beamline Suite will measure the electronic, chemical, and structural properties of almost any material, often at the nanoscale, providing a route to answering key problems faced in microelectronics, biology, energy, and nanotechnology. 

Beamline for Material Measurement (BMM)

The mission of BMM is to apply X-ray Absorption Spectroscopy (XAS) and X-ray Diffraction (XRD) to the materials science of important societal challenges in energy, health, environment, and national security; to establish structure/function relationships in advanced materials, often at the nanoscale; to accelerate the development of new materials into devices and systems with advanced functionality; and to promote innovation which enhances U.S. industrial competitiveness.

Spectroscopy with Soft and Tender X-rays (SST-I and SST-II)

The mission of SST is to apply X-ray Photoelectron Spectroscopy (XPS) and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy to the materials science of important societal challenges in energy, health, environment, and national security; to establish structure/function relationships in advanced materials, often at the nanoscale; to accelerate the development of new materials into devices and systems with advanced functionality; and to promote innovation which enhances U.S. industrial competitiveness.