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ACMD Seminar: IoT-LPWAN testing project for security and trust in networks of sensors

Sebastian Barillaro
National Institute for Industrial Technology, INTI

Tuesday, October 23, 15:00 - 16:00
Building 227 Room A202

Tuesday, October 23, 13:00 - 14:00
Building 1 Room 4072

Co-sponsored with ITL Computer Security Division (CSD)
Hosts: Lee Badger (773) and Raghu Kacker (771)

Abstract: Inexpensive battery-powered sensors are transforming science and technology, including metrology. Networks of sensors are an important class of Internet of Things (IoT) and Cyber-Physical Systems (CPS). Low Power Wide Area Networks (LPWAN) is a telecommunication technology especially designed for networks where data to be transmitted is limited (such as sensor data) and communication is intermittent. LPWAN systems have end-to-end encryption, cover wide areas, and are very energy efficient. We have prototyped two NIST use-cases for LPWAN-based sensor networks. The development of such use-cases is important for building a principled understanding of the security and trust issues of LPWAN-based telecommunications. We are investigating potential security weaknesses and possible mitigations arising out of our experience with LPWAN technology.

Bio: Sebastian Barillaro is a guest researcher under the NIST-SIM Engagement Opportunity Program. He is an employee of the National Institute for Industrial Technology (INTI), the national metrology institute of Argentina, and teaches at the La Matanza National University (UNLaM). He works on software security of embedded systems and on development of IoT solutions. After arrival in NIST on July 2017, he identified Low Power Wide Area Networks (LPWAN) as cheaper technologies of growing interest for IoT systems. Sebastian is leading the design and development of a LPWAN-IoT test facility in NIST.

Note: Visitors from outside NIST must contact Cathy Graham; (301) 975-3800; at least 24 hours in advance.


Created October 9, 2018, Updated November 15, 2019