Ionizing radiation metrology

News and Updates

EBIT’s Improved X-ray Vision Promises Astronomical Insights

April 25, 2019

Look at an astronomical marvel like the Cat’s Eye Nebula at right, with an average gas temperature about twice as hot as the surface of the Sun. It seems

Photonic Radiation Sensors Survive Huge Doses Undamaged

November 27, 2018

Researchers at the National Institute of Standards and Technology (NIST) have published landmark test results that suggest a promising class of sensors can be

Getting the Inside Story on Products with Computed Tomography

February 22, 2017

It is often the case that a valuable new industrial capability brings with it a whole new set of challenges for measurement science -- and thus, inevitably, for

Projects and Programs

Basic Metrology: Dose/Dose-Rate Effects in Alanine Dosimetry

Ongoing

Check standards are used by the NIST Radiation Physics Division to monitor the performance of the alanine dosimetry system that is central to its high-dose

Multiscale structure and dynamics in advanced technological materials

Ongoing

This project develops and applies metrologies and standards for characterizing microstructure and dynamics in advanced functional materials of technological

Basic Metrology: Theoretical Dosimetry and Radiation-Transport Calculations

Ongoing

The fundamental photon and charged particle interaction data and the radiation transport methods, pioneered and developed at NIST to calculate the penetration

Photonic Dosimetry

Ongoing

As part of the NIST on a Chip program, the Photonic Dosimetry project is developing in-situ sub-micrometer ionizing-radiation dosimetry and calorimetry leading

Publications

Addressable graphene encapsulation of wet specimens on a chip for optical, electron, infrared and X-ray based spectromicroscopy studies

October 15, 2021

Author(s)

Andrei Kolmakov

Label-free spectromicroscopy methods offer the capability to examine complex cellular phenomena. Electron and X-ray based spectromicroscopy methods, though

Decision Tree for Key Comparisons

April 27, 2021

Author(s)

Antonio Possolo, Amanda Koepke, David Newton, Michael R. Winchester

This contribution describes a Decision Tree intended to guide the selection of statistical models and data reduction procedures in key comparisons (KCs). The

Ra-224 activity, half-life, and 241 keV gamma ray absolute emission intensity: a NIST-NPL bilateral comparison

December 31, 2020

Author(s)

Denis E. Bergeron, Sean Collins, Leticia Pibida, Jeffrey T. Cessna, Ryan P. Fitzgerald, Brian E. Zimmerman, Peter Ivanov, John Keightley, Elisa Napoli

The national metrology institutes for the United Kingdom and the United States have compared activity standards for 224Ra, an -particle emitter of interest as

The Next Generation of Current Measurement for Ionization Chambers

September 1, 2020

Author(s)

Ryan P. Fitzgerald, Denis E. Bergeron, Dean G. Jarrett, Neil M. Zimmerman, Carine Michotte, Hansjoerg Scherer, Stephen Giblin, Steven Judge

Re-entrant ionization chambers (ICs) are essential to radionuclide metrology and nuclear medicine for maintaining standards and measuring half-lives. Metrology

Tools and Instruments

X-ray Backscatter Systems

X-ray backscatter systems are used for the screening of personnel for hidden weapons and other contraband. Unlike conventional radiographic x-ray systems