X-ray Diffraction Pattern or Diffractogram
the characteristic interference pattern obtained when X-rays are diffracted by a crystalline substance; the geometry of the pattern is a function of the repeat distances (lattice dimensions) of the periodic array of atoms in the crystals; the intensities of the diffracted beams give information about the atomic arrangement, and unit-cell dimensions.
Committee
Trace Materials
Date Added to Lexicon
Standard Source (Designation Number Title of Standard. Publisher, Place, Year.)
ANSI/ASTM E1732 Standard Terminology Relating to Forensic Science. ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428, 2025.
Source link
Reprinted, with permission, from ASTM E1732 Standard Terminology Relating to Forensic Science, copyright ASTM International, 100 Barr Harbor Drive, West Conshohocken, PA 19428. A copy of the complete standard is available from ASTM International, https://www.astm.org