EEEL Staff Member Wins the IEEE EMC Society Stoddart Award

Dr. Chris Holloway of the EEEL Electromagnetics Division was awarded the 2008 IEEE Electromagnetic Compatibility Society Stoddart Award. The Stoddart Award is the highest technical award given by the IEEE Electromagnetic Compatibility Society. The award recognized his many significant contributions to advances in electromagnetic compatibility (EMC) analysis and test methods. The citation reads, "For fundamental contributions to material modeling and applications in electromagnetic compatibility." Dr. Holloway in collaboration with EEEL colleagues has had particular impact in the area of microwave absorber and anechoic chamber modeling. This work has lead to new generations of absorber with tailored material properties as a function of geometry resulting in better performance, lower weight, and lower cost. Dr. Holloway has also pioneered the analysis and testing of double negative index materials (negative permittivity and permeability) for various applications. Dr. Holloway received the award at the recent 2008 IEEE International Symposium on Electromagnetic Compatibility held in August in Detroit, MI.