The Material Measurement Laboratory of the National Institute of Standards and Technology (NIST) is seeking a qualified person (U.S. citizen preferred) to join a metrology development project in the use of Brillouin, low-frequency Raman (LFR) and fluorescence lifetime imaging (FLIM) microscopy for the study the mechanical properties of complex polymeric materials relevant to advanced semiconductor packaging applications. Candidate will conduct high-level, independent research, developing cutting-edge measurement techniques and methods for characterization of semiconductor industry-relevant materials.
This opportunity is to be an associate researcher in the NIST Materials Measurement Science Division for a term of 1 year, with options to renew. Associate researchers are NOT Federal Employees, but they work along with NIST researchers and with NIST’s world-class instrumentation. Relocation expenses will not be provided. U.S. citizens hired into associate positions may have the opportunity to seek longer term Federal Employment.
Interested persons (U.S. citizens preferred) who meet all of the required qualifications are invited to express their interest by sending an email that briefly describes their qualifications along with a CV to 643assoc [at] nist.gov (643assoc[at]nist[dot]gov). U.S. citizens should note “U.S. Citizen” and the opportunity title in the email subject line. All others should note “Non-U.S. Citizen” and the opportunity title in the email subject line.