The Material Measurement Laboratory of the National Institute of Standards and Technology (NIST) is seeking qualified persons (U.S. citizens preferred) to join a team of researchers within the NIST/CHIPS Nanometer-Scale Planar Reference Materials project working with advanced metrology methods to characterize local physical and chemical properties and map any variation in these properties of thin, nanometer-scale films deposited on Si (and SiC) wafers. The candidate will measure and analyze these wafers using X-ray and optical methods to determine, through hybrid metrology, structural maps for wafers with thin films of interest to the semiconductor community.
This opportunity is for an associate researcher in the NIST Materials Measurement Science Division for a term of one year, with options to renew. Associate researchers are NOT Federal Employees, but they work along with NIST researchers and with NIST’s world-class instrumentation. Relocation expenses will not be provided. U.S. citizens hired into associate positions may have the opportunity to seek longer term Federal Employment.
Interested persons (U.S. citizens preferred) who meet all of the required qualifications are invited to express their interest by sending an email that briefly describes their qualifications along with a CV to 643assoc [at] nist.gov (643assoc[at]nist[dot]gov). U.S. citizens should note “U.S. Citizen” and the opportunity title in the email subject line. All others should note “Non-U.S. Citizen” and the opportunity title in the email subject line.