On November 3, 2023, Marla Dowell, Director of CHIPS R&D Metrology and NIST Boulder Laboratory, was recognized by the President of the United States as a Distinguished Executive for her extraordinary and lasting contributions to scientific research and achievements as a leader in the NIST community.
In her more than 15 years of service in the federal government, Dowell has made significant contributions to advanced communications standards and measurement science. Her work in the field of optical metrology for photolithography has enabled better optical measurements for photodynamic therapy to treat cancer, laser safety, communications, and manufacturing, and her leadership has been widely recognized in the public sector and academia.