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2023 IEEE EDS Leo Esaki Award

2023 IEEE EDS Leo Esaki Award
Credit: K. Dill/NIST

For recognizing the best paper appearing in a fast turnaround archival publication of the IEEE Electron Devices Society, targeted to the IEEE Journal of Electron Devices Society.

For their paper: Ultrafast ID-VG Technique for Reliable Cryogenic Device Characterization.

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Created May 10, 2024, Updated June 17, 2024
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