The Leo Esaki Award was established in 2019 to recognize the best paper appearing in a fast turn around archival publication of the IEEE Electron Devices Society, targeted to the IEEE Journal of Electron Devices Society.
For recognizing the best paper appearing in a fast turnaround archival publication of the IEEE Electron Devices Society, targeted to the IEEE Journal of Electron Devices Society.
For their paper: Ultrafast ID-VG Technique for Reliable Cryogenic Device Characterization.