Verkouteren, J.
and Conny, J.
(2008),
XRD Rietveld Simulations Y<sub>2</sub>O<sub>3</sub> - ZrO<sub>2</sub> Phases, Journal of the American Ceramic Society
(Accessed June 12, 2025)
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XRD Rietveld Simulations Y2O3 - ZrO2 Phases
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Abstract
X-ray diffraction patterns of tetragonal and cubic yttria-stabilized were simulated to test the capability of Rietveld refinement to accurately seperate the phases. The effects of peak broadening and different c/a ratios on the refinement results were investigated. Rietveld refinement is capable of separating the patterns of the two phases, even for assemblages containing high-yttria (10 mol% YO1.5) tetragonal phases. The errors in refinement of mass fraction are generally less than 20% relative, and the errors in lattice parameters are less than 0.002 Angstrom}, or ± 1 mol % YO1.5.Citation
Journal of the American Ceramic Society
Pub Type
Journals
Keywords
plasma-sprayed, PSZ, Rietveld refinement, thermal barrier coating, x-ray diffraction, yttria-stablized zirconia
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Created October 16, 2008