NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

XRD Rietveld Simulations Y2O3 - ZrO2 Phases

Published

Author(s)

Jennifer R. Verkouteren, Joseph M. Conny

Abstract

X-ray diffraction patterns of tetragonal and cubic yttria-stabilized were simulated to test the capability of Rietveld refinement to accurately seperate the phases. The effects of peak broadening and different c/a ratios on the refinement results were investigated. Rietveld refinement is capable of separating the patterns of the two phases, even for assemblages containing high-yttria (10 mol% YO1.5) tetragonal phases. The errors in refinement of mass fraction are generally less than 20% relative, and the errors in lattice parameters are less than 0.002 Angstrom}, or ± 1 mol % YO1.5.
Citation
Journal of the American Ceramic Society
Pub Type
Journals

Keywords

plasma-sprayed, PSZ, Rietveld refinement, thermal barrier coating, x-ray diffraction, yttria-stablized zirconia

Citation

Verkouteren, J. and Conny, J. (2008), XRD Rietveld Simulations Y<sub>2</sub>O<sub>3</sub> - ZrO<sub>2</sub> Phases, Journal of the American Ceramic Society (Accessed October 11, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created October 16, 2008
Was this page helpful?