Seely, J.
, Hudson, L.
, Weaver, J.
, Holland, G.
and Boyer, C.
(2002),
X-Ray Spectroscopy and Calibrations in the 50 eV to 60 keV, ed. by B. Barber, H. Roehrig, P. Doty, L. Porter, and E. Morton, SPIE Conference Proc on Penetrating Radiation Systems and Applications IV</I>
(Accessed December 7, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
X-Ray Spectroscopy and Calibrations in the 50 eV to 60 keV, ed. by B. Barber, H. Roehrig, P. Doty, L. Porter, and E. Morton
Published
Author(s)
J Seely, , J L. Weaver, G E. Holland, C N. Boyer
Citation
SPIE Conference Proc on Penetrating Radiation Systems and Applications IV</I>
Volume
4786
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 2001, Updated October 12, 2021