X-ray computed tomography instrument performance evaluation: Detecting geometry errors using a calibrated artifact
Balasubramanian Muralikrishnan, Katharine M. Shilling, Steven D. Phillips, Wei Ren, Vincent D. Lee, Felix H. Kim, Gabriel Alberts, Valentina Aloisi
X-ray computed tomography (XCT) is uniquely suitable for non-destructive dimensional metrology of delicate or internal features generated from the additive manufacturing process. While XCT has long been used in medical imaging, it has only been used for industrial dimensional metrology in recent years. The error sources involved in XCT measurements of industrial components is still a topic of active research. Uncorrected XCT instrument geometry errors, such as detector misalignment or rotation stage errors, are one potential source of error in XCT measurements, and the focus of this paper. Here, we demonstrate the effect of some instrument geometry error parameters on measurements performed on a calibrated artifact and compare the results to those obtained through simulations. The overall objective of this work is to support ongoing efforts to develop documentary national and international standards for performance evaluation of XCT systems.
Proceedings of the SPIE
April 14-18, 2019
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