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A workshop report on "electron microscopy frontiers: challenges and opportunities":

Published

Author(s)

John Bonevich, Ann Chiaramonti Debay, Andrew Herzing, Bob Keller, June Lau
Citation
- NIST SP 1217
Report Number
NIST SP 1217

Citation

Bonevich, J. , Chiaramonti Debay, A. , Herzing, A. , Keller, B. and Lau, J. (2017), A workshop report on "electron microscopy frontiers: challenges and opportunities":, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.1217 (Accessed April 21, 2024)
Created December 1, 2017, Updated May 20, 2023