On-Wafer Transistor Characterization to 750 GHz the approach, results, and pitfalls
Dylan F. Williams, Jerome G. Cheron, Benjamin F. Jamroz, Richard A. Chamberlin
We review approaches developed at the National Institute of Standards and Technology for on-wafer transistor characterization and model extraction at sub-millimeter-wave wavelengths, and compare them to more common approaches developed for use at lower frequencies. We discuss important improvements in accuracy, approaches to estimating the uncertainty of the procedure, and recent research on further improving these methods.
BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium Digest
October 14-17, 2018
San Diego, CA
BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium