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Voltage Metrology Using a Quantum AC Standard

Published

Author(s)

Thomas E. Lipe, Joseph R. Kinard Jr., Yi-hua Tang, Samuel P. Benz, Charles J. Burroughs, Paul D. Dresselhaus

Abstract

We report on the use of a quantum-based AC voltage standard for ac-dc difference metrology at the National Institute of Standards and Technology (NIST). The paper describes the characterization of the output transmission line, and the methods used to correct for its errors, the use of the quantum standard in voltage scaling, and its use in the NIST calibration services for thermal voltage converters. Plans for future use are also presented.
Volume
10
Issue
3
Conference Dates
September 25-27, 2013
Conference Location
Buenos Aries
Conference Title
10th International Conference on Electrical Metrology (X SEMETRO)

Keywords

AC Voltage, Josephson Effect, Voltage Measurement, Josephson Voltage Standard

Citation

Lipe, T. , Kinard, J. , Tang, Y. , Benz, S. , Burroughs, C. and Dresselhaus, P. (2015), Voltage Metrology Using a Quantum AC Standard, 10th International Conference on Electrical Metrology (X SEMETRO), Buenos Aries, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=913623 (Accessed April 16, 2024)
Created September 1, 2015, Updated June 7, 2017