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PUBLICATIONS

Volatile Data Stream (VDS) for the Smart Manufacturing Systems (SMS) Test Bed using MTConnect

Published

Author(s)

Moneer M. Helu, Thomas D. Hedberg, Allison Barnard Feeney, Mark E. Luce

Abstract

Data is collected from the Manufacturing Lab using the MTConnect standard. That data is aggregated and published internally and externally of NIST via web services. Three channels of data dissemination are available or becoming available from the SMS Test Bed: (1) a volatile data stream using an MTConnect agent, (2) a query-able data repository using the NIST Material Data Curation System (MDCS), and (3) pre-compiled data packages that include a collection of CAx Lab data and associated Manufacturing Lab data.
Citation
Smart Manufacturing Systems (SMS) Test Bed: Volatile Data Stream (VDS)
Pub Weblink
https://smstestbed.nist.gov/vds/current
Pub Type
Websites

Download Paper

DOI Link

Keywords

MTConnect, Test Bed, cyber-physical systems
Manufacturing and Manufacturing systems design and analysis

Citation

Helu, M. , Hedberg, T. , Barnard, A. and Luce, M. (2016), Volatile Data Stream (VDS) for the Smart Manufacturing Systems (SMS) Test Bed using MTConnect, Smart Manufacturing Systems (SMS) Test Bed: Volatile Data Stream (VDS), [online], https://doi.org/10.18434/T4FK54, https://smstestbed.nist.gov/vds/current (Accessed October 6, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 15, 2016, Updated November 10, 2018