Balzar, D.
(1999),
Voight Function Model in Diffraction-Line Broadening Analysis, Defect and Microstructure Analysis by Diffraction
(Accessed September 9, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Voight Function Model in Diffraction-Line Broadening Analysis
Published
Author(s)
Abstract
Diffraction-line broadening routes are briefly reviewed. Both luboratory and synchrotron X-ray measurements of W and MgO showed that a Voigt function satisfactory fits the physically broadened line profiles. The consequences of an assumed Voigt function profile shape for both si/c broadened and strain-broadened profiles (double-Voigt method) are studied. It is shown that the relationship between parameters obtained by the Warren Averbach approximation and integral-breadth methods becomes possible. Line-broadening analysis of W and Mg() is performed by using the Warren Averbach and 'double-Voigt approaches and results are compared.Citation
Defect and Microstructure Analysis by Diffraction
Volume
Chap. 7
Pub Type
Journals
Keywords
diffraction line broadening, function, microstructure, synchrotron radiation, x-ray diffraction
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 1, 1999, Updated February 17, 2017