Voight Function Model in Diffraction-Line Broadening Analysis

Published

February 1, 1999

Author(s)

Davor Balzar

Abstract

Diffraction-line broadening routes are briefly reviewed. Both luboratory and synchrotron X-ray measurements of W and MgO showed that a Voigt function satisfactory fits the physically broadened line profiles. The consequences of an assumed Voigt function profile shape for both si/c broadened and strain-broadened profiles (double-Voigt method) are studied. It is shown that the relationship between parameters obtained by the Warren Averbach approximation and integral-breadth methods becomes possible. Line-broadening analysis of W and Mg() is performed by using the Warren Averbach and 'double-Voigt approaches and results are compared.

Citation

Defect and Microstructure Analysis by Diffraction

Volume

Chap. 7

Pub Type

Journals

Keywords

diffraction line broadening, function, microstructure, synchrotron radiation, x-ray diffraction

Citation

Balzar, D. (1999), Voight Function Model in Diffraction-Line Broadening Analysis, Defect and Microstructure Analysis by Diffraction (Accessed April 20, 2024)