Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Variable-Temperature Critical-Current Measurements on a Nb3Sn Wire

Published

Author(s)

Loren F. Goodrich, Theodore C. Stauffer

Abstract

We made variable-temperature critical-current (Ic) measurements on a commercial multifilamentary Nb3Sn wire for temperatures (T) from 4 to 17 K and magnetic fields (H) from 0 to 12 T using transport current. The sample had a diameter of 0.811 mm and a Cu/non-Cu ratio of about 1.5. The measurements cover the range of critical currents from less than 0.01 A to over 700 A. To verify the measurements at variable temperature, we compared critical currents up to 400 A on a specimen that was immersed in liquid helium to those on the same specimen in flowing helium gas. This comparison indicated our ability to control and measure specimen temperature was within 40 mK. The critical-current data presented include electric field- current (E-I) characteristics, and E-T characteristics at constant I and H,Ic(H) at constant T, and Ic(T) at constant H. Such data may be used to determine the temperature margin of magnet applications.
Citation
IEEE Transactions on Applied Superconductivity
Volume
15
Issue
2

Keywords

critical-current measurement, electric field-current characteristic, Niobium compound, superconducting wires, temperature control, temperature margin

Citation

Goodrich, L. and Stauffer, T. (2005), Variable-Temperature Critical-Current Measurements on a Nb<sub>3</sub>Sn Wire, IEEE Transactions on Applied Superconductivity, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31795 (Accessed December 5, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 31, 2005, Updated October 12, 2021