Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors

Published

April 1, 2012

Author(s)

Lyle E. Levine, P. Geantil, B C. Larson, Jonathan Tischler, Michael E. Kassner, Wenjun Liu

Abstract

Dislocation structures in deformed metals produce broad, asymmetric diffraction line profiles. During analysis, these profiles are generally separated into two nearly symmetric subprofiles corresponding to dislocation cell walls and cell interiors. These subprofiles are then interpreted using complex models of dislocation-based line broadening. Until now, it has not been possible to test the many assumptions that are made in such an analysis. Here, depth-resolved microbeam diffraction was used to measure diffraction line profiles from numerous individual dislocation cell walls and cell interiors in a heavily deformed Cu single crystal. Summing these profiles allowed us to reconstruct the cell interior and cell wall subprofiles that have been approximated in the line profile analysis literature for the past 30 years. Direct comparison between our reconstructed subprofiles and the macroscopic asymmetric line profile from the same sample allows the first direct tests of the many assumptions that have been used for interpreting these X-ray measurements.

Citation

Journal of Applied Crystallography

Volume

45

Pub Type

Journals

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DOI Link

Keywords

Microbeam diffraction, line profile analysis, x-ray diffraction, dislocations

Citation

Levine, L. , Geantil, P. , Larson, B. , Tischler, J. , Kassner, M. and Liu, W. (2012), Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors, Journal of Applied Crystallography, [online], https://doi.org/10.1107/S0021889812001616 (Accessed October 14, 2025)