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Using Frequency Detuning to Improve the Sensitivity of Electric Field Measurements via Electromagnetically Induced Transparency and Autler-Townes Splitting In Rydberg Atoms

Published

Author(s)

Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon

Abstract

In this work we demonstrate an approach for improved sensitivity in weak RF electric-field measurements using Rydberg EIT in an atomic vapor. This is accomplished by varying the RF frequency around a resonant atomic transition and extrapolating the weak on-resonant field strength from the resulting off-resonant Autler-Townes (AT) splittings. This measurement remains directly traceable to SI compared to previous techniques, precluding any knowledge of experimental parameters such as optical beam powers as is the case when using the curvature of the EIT line shape to measuring weak fields. We use this approach to measure weak RF fields at 182 GHz and 208 GHz demonstrating a factor of at least 2 improvement in the measurements sensitivity compared to on-resonant AT splitting RF electric field measurements.
Citation
Applied Physics Letters

Keywords

atom based metrology, electric fields, EIT, Aulter Townes

Citation

Holloway, C. , Simons, M. and Gordon, J. (2016), Using Frequency Detuning to Improve the Sensitivity of Electric Field Measurements via Electromagnetically Induced Transparency and Autler-Townes Splitting In Rydberg Atoms, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=920398 (Accessed April 21, 2024)
Created March 14, 2016, Updated November 14, 2017