Understanding Microstructural Effects on Long Term Electrical Fatigue in Multilayer PZT Actuators

Published

April 6, 2006

Author(s)

Jens Mueller

Abstract

In this study, multilayered PbTi(x)Zr(1-x)O3 (PZT) samples were produced by tape-casting and subsequent sintering at temperatures in the range of 1175 degrees C to 1325 degrees C. Sintering times were 6 and 24 minutes. Samples were poled and also electrically fatigued by long-term exposure (about 10E6 cycles) to cyclic electric fields. The parameters of initial and remnant polarization were estimated from hysteresis loops. Changes in the crystallographic microstructure as a function of sintering temperature TS and sintering time were examined by scanning electron microscopy (SEM) and X-ray diffraction (XRD) to gain insight on fatigue mechanisms and their prevention. The microstructural results, such as domain reorientation and amount of secondary phases, explained the results of electrical observations. We found that grain sizes and internal strains were major influence factors on device performance. Domain sizes were about two orders of magnitude smaller than grain sizes. Therefore, domain-grain wall interaction did not influence domain switching. Domain wall movement was facilitated in samples processed at TS less than 1250 degrees C, and such samples were more resistant to electrical fatigue. Samples degraded faster at TS above 1250 degrees C, but here a higher device performance power was found due to an increased unit cell tetragonality that yielded higher polarization values.

Volume

6170

Conference Dates

February 26-March 2, 2006

Conference Location

San Diego, CA

Conference Title

SPIE (The International Society for Optical Engineering) Smart Structures and Materials

Pub Type

Conferences

Download Paper

https://doi.org/10.1117/12.658847

Keywords

domain reorientation, domain size, electrical fatigue, grain size, hysteresis, lead zirconate titanate, PbTi(x)Zr(1-x)O3 (PZT), SEM, sintering, XRD

Citation

Mueller, J. (2006), Understanding Microstructural Effects on Long Term Electrical Fatigue in Multilayer PZT Actuators, SPIE (The International Society for Optical Engineering) Smart Structures and Materials, San Diego, CA, [online], https://doi.org/10.1117/12.658847 (Accessed April 26, 2024)