A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.
Proceedings Title: CPEM 2008
Conference Dates: June 8-13, 2008
Conference Location: Broomfield, CO
Conference Title: Conference on Precision Electromagnetic Measurements
Pub Type: Conferences