This tutorial discusses the importance of citing valid uncertainties when reporting analytical results and the need for a universally accepted approach for evaluating uncertainties. Today, the CIPM procedure has been accepted by numerous international organizations, as well as accepted and used by NIST. The basics of the CIPM approach are described and it is applied to the equations used in wavelength dispersive electron probe microanalysis quantification with an experimental example.
Proceedings Title: European Microbeam Analysis Society 2009
Conference Dates: May 10-14, 2009
Conference Location: Gdansk, -1
Conference Title: 11th European Workshop on Modern Developments and Applications in Microbeam Analysis
Pub Type: Conferences
"CIPM approach", "electron probe microanalysis", "microanalysis", "standard uncertainty", "uncertainty"