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Ultraviolet to Short-Wave Infrared Spectral Reflectance

Published

Author(s)

Heather Patrick, Clarence Zarobila

Abstract

The National Institute of Standards and Technology performs calibrations of spectral reflectance measurements in the ultraviolet (UV) to short-wave infrared (SWIR) spectral regions using the Robotic Optical Scattering Instrument (ROSI) and its associated Reference Integrating Sphere (RIS). This special publication gives a comprehensive overview of the design, operation, and capabilities of this facility. Measurement methods for spectral reflectance, the elements of the uncertainty budget, and validation of the reflectance scale through comparison with NIST's previous reference instrument, the Spectral Tri-function Automated Reference Reflectometer (STARR), are described. Examples of calibration measurements, including specular reflectance of mirrors, bidirectional reflectance of diffuse reflectors, and directional-hemispherical reflectance, are given. Examples of typical calibration reports are also provided.
Citation
Special Publication (NIST SP) - 250-101
Report Number
250-101

Keywords

Bidirectional reflectance distribution function, directional-hemispherical reflectance, optical properties of materials, reflectance, reflectance factor, diffuse reflectance, spectral reflectance, specular reflectance.

Citation

Patrick, H. and Zarobila, C. (2024), Ultraviolet to Short-Wave Infrared Spectral Reflectance, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.250-101 , https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956799 (Accessed November 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 28, 2024