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Two-terminal and multi-terminal designs for next generation quantized Hall resistance standards: contact material and geometry

Published

Author(s)

Mattias Kruskopf, Albert Rigosi, Alireza Panna, Dinesh K. Patel, Hanbyul Jin, Martina Marzano, Michael Berilla, David B. Newell, Randolph Elmquist
Citation
IEEE Transactions on Electron Devices

Citation

Kruskopf, M. , Rigosi, A. , Panna, A. , Patel, D. , Jin, H. , Marzano, M. , Berilla, M. , Newell, D. and Elmquist, R. (2019), Two-terminal and multi-terminal designs for next generation quantized Hall resistance standards: contact material and geometry, IEEE Transactions on Electron Devices, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927830 (Accessed September 27, 2022)
Created July 20, 2019, Updated January 4, 2022