Two Level System Loss in Superconducting Microwave Resonators

Published

January 13, 2011

Author(s)

David P. Pappas, Michael R. Vissers, David S. Wisbey, Jeffrey S. Kline, Jiansong Gao

Abstract

High quality factor, i.e. low loss, resonators are important for quantum information storage and addressing. In this work we study the resonance frequency and loss in superconducting coplanar waveguide resonators as a function of temperature and power. We find that there is increased loss at low power and low temperature. The increased loss is attributed to the existence of two-level systems at the surfaces, interfaces, and in the bulk of insulators deposited on the structures. We show how the power dependence of the quality factor and the temperature dependence of the resonant frequency can both be used to find the zero temperature contribution to the loss from TLS. We find a close correspondence of these two independent measurements of TLS loss is evaluated. The most important aspect of these measurements is that the TLS contribution can be obtained from the frequency shift vs. temperature at high power, allowing for a reliable and fast measurement of the TLS contribution.

Proceedings Title

IEEE Transactions on Applied Superconductivity

Volume

21

Issue

3

Conference Dates

August 2-6, 2010

Conference Location

Washington, DC

Conference Title

Applied Superconductivity Conference

Pub Type

Conferences

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DOI Link

Keywords

superconducting resonators, two level systems

Citation

Pappas, D. , Vissers, M. , Wisbey, D. , Kline, J. and Gao, J. (2011), Two Level System Loss in Superconducting Microwave Resonators, IEEE Transactions on Applied Superconductivity , Washington, DC, [online], https://doi.org/10.1109/TASC.2010.2097578 (Accessed October 9, 2025)