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Two Layer Dielectric Microstrip Line Structure: SiO2 on Si and GaAs on Si: Modeling and Measurement

Published

Author(s)

R A. Lawton, W. T. Anderson
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
MTT-36
Issue
4

Citation

Lawton, R. and Anderson, W. (1988), Two Layer Dielectric Microstrip Line Structure: SiO2 on Si and GaAs on Si: Modeling and Measurement, IEEE Transactions on Microwave Theory and Techniques (Accessed April 18, 2024)
Created March 31, 1988, Updated October 12, 2021