Lawton, R.
and Anderson, W.
(1988),
Two Layer Dielectric Microstrip Line Structure: SiO2 on Si and GaAs on Si: Modeling and Measurement, IEEE Transactions on Microwave Theory and Techniques
(Accessed October 1, 2023)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Two Layer Dielectric Microstrip Line Structure: SiO2 on Si and GaAs on Si: Modeling and Measurement
Published
Author(s)
R A. Lawton, W. T. Anderson
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
MTT-36
Issue
4
Pub Type
Journals
Citation
Created March 31, 1988, Updated October 12, 2021