Lawton, R.
and Anderson, W.
(1988),
Two Layer Dielectric Microstrip Line Structure: SiO2 on Si and GaAs on Si: Modeling and Measurement, IEEE Transactions on Microwave Theory and Techniques
(Accessed April 26, 2025)
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Two Layer Dielectric Microstrip Line Structure: SiO2 on Si and GaAs on Si: Modeling and Measurement
Published
Author(s)
R A. Lawton, W. T. Anderson
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
MTT-36
Issue
4
Pub Type
Journals
Citation
Issues
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Created March 31, 1988, Updated October 12, 2021