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Two-Dimensional Index Profiling of Fibers and Waveguides

Published

Author(s)

N. H. Fontaine, M. Young

Abstract

We have constructued a two-dimensional refracted-ray scanner that can resolve index-of-refraction increments of approximately 4 x 10-5. this resolution is an order of magnitude finer than the uncertainty of the measurement. The scanner can be adapted to evaluate either fibers or planar waveguides. The two-dimensional scan and the high precision allow visualization of features, such as deposition layers, that are difficult if not impossible to see in conventional one-dimensional scans.
Citation
Optics Letters
Volume
38
Issue
33

Keywords

critical angle, collimation, fibers, index of refraction, index profile, metrology, multimode, refracted near-field, single-mode

Citation

Fontaine, N. and Young, M. (1999), Two-Dimensional Index Profiling of Fibers and Waveguides, Optics Letters (Accessed June 19, 2024)

Issues

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Created November 19, 1999, Updated October 12, 2021