Watts, R.
, Liang, S.
, Levine, Z.
, Lucatorto, T.
, Polack, F.
and Scheinfein, M.
(1997),
A Transmission X-Ray Microscope Based on Secondary-Electron Imaging,, Review of Scientific Instruments
(Accessed December 15, 2024)
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A Transmission X-Ray Microscope Based on Secondary-Electron Imaging,
Published
Author(s)
, S D. Liang, , , F Polack, M R. Scheinfein
Citation
Review of Scientific Instruments
Volume
68
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1997, Updated February 17, 2017