Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

A Transmission X-Ray Microscope Based on Secondary-Electron Imaging,

Published

Author(s)

R N. Watts, S D. Liang, Zachary H. Levine, Thomas B. Lucatorto, F Polack, M R. Scheinfein
Citation
Review of Scientific Instruments
Volume
68

Citation

Watts, R. , Liang, S. , Levine, Z. , Lucatorto, T. , Polack, F. and Scheinfein, M. (1997), A Transmission X-Ray Microscope Based on Secondary-Electron Imaging,, Review of Scientific Instruments (Accessed May 30, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 1997, Updated February 17, 2017