Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Transfer-characteristics and low-frequency noise in single and multi-layer MoS2 field-effect transistors

Published

Author(s)

Abhishek Motayed, Albert Davydov, Deepak K. Sharma, Qiliang Li
Citation
Applied Physics Letters

Citation

Motayed, A. , Davydov, A. , Sharma, D. and Li, Q. (2015), Transfer-characteristics and low-frequency noise in single and multi-layer MoS2 field-effect transistors, Applied Physics Letters (Accessed December 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 19, 2015, Updated March 15, 2017