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PUBLICATIONS

Towards a Traceable Nanoscale Force Standard

Published

Author(s)

Jon R. Pratt, David B. Newell, Edwin R. Williams, Douglas T. Smith, John A. Kramar

Abstract

The National Institute of Standards and Technology has launched a five-year project to traceably link the International System of Units (SI) to forces between 10-8N and 10-2N. In this paper, we give a background and overview of this project, discuss the electrostatic realization and dissemination of force through a mechanical balance, and provide a brief summary of the Microforce Laboratory being constructed at NIST.
Conference Dates
May 27-31, 2001
Conference Location
Turin, IT
Conference Title
Proceedings of the EUSPEN International Conference
Pub Type
Conferences

Keywords

AFM, force, measurement, MEM's, nanoindentation
Manufacturing and Metrology

Citation

Pratt, J. , Newell, D. , Williams, E. , Smith, D. and Kramar, J. (2001), Towards a Traceable Nanoscale Force Standard, Proceedings of the EUSPEN International Conference, Turin, IT (Accessed February 11, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created May 1, 2001, Updated February 19, 2017