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Towards Near Perfect Crystals With Only Well-Characterized Imperfections

Published

Author(s)

H S. Peiser

Abstract

Throughout the past century NBS/NIST supported a great variety of research studies in crystallography where the aim was the highest attainable accuracy in measurement. While avoiding overlap with other papers in this volume, this article summarizes results from 1) early work on crystallization as a method of purification, in contributions to sugar chemistry, and in solution growth of large crystals; 2) the NBS/ARPA Program of research on crystal growth and characterization; 3) the NBS free-radical Research Program; 4) the XRCD method as a direct path to atomic weights data and the fundamental physical constants; 5) the dynamical theory of X-ray diffraction; and 6) symmetry considerations such as are involved in the influence on crystals of mechanical stress or fields, and of point defect motion.
Citation
Journal of Research (NIST JRES) -
Volume
106 No. 6

Keywords

ARPA, crystallography, dislocations, free-radicals, melt growth, point defects, purification, solution growth, symmetry of crystals etc

Citation

Peiser, H. (2002), Towards Near Perfect Crystals With Only Well-Characterized Imperfections, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed June 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 1, 2002, Updated February 19, 2017