Toward traceable XCT measurement of AM lattice structures: Uncertainty in calibrated reference object measurement

Published

May 26, 2022

Author(s)

Maxwell Praniewicz, Jason Fox, Christopher Saldana

Abstract

Lattice structures created via additive manufacturing are of interest in several demanding industries, however the qualification of these components via X-ray computed tomography (XCT) is limited due to traceability requirements. In this work, a novel measurement reference object is presented to study task specific uncertainty in the XCT measurement of a simplified lattice structure. The design of this reference object, the calibration routines, and XCT acquisition are described. The description of uncertainty calculation is presented. The methodology for data sampling, registration, and measurement is detailed. The measurement results are tested for normality and show variations in the underlying distribution for different measurands. A discussion on uncertainty variation and normality of measurements is then presented. Variations in measurement bias and uncertainty are analyzed across various features of the reference object. It is shown that the measurement uncertainty and bias are not consistent across pin diameter measurement, indicating the need for similarity between the reference object and subsequent component measurements.

Citation

Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology

Volume

77

Pub Type

Journals

Download Paper

https://doi.org/10.1016/j.precisioneng.2022.05.010

Local Download

Keywords

Qualification, Lattices, Additive Manufacturing, X-ray Computed Tomography, Uncertainty

Citation

Praniewicz, M. , Fox, J. and Saldana, C. (2022), Toward traceable XCT measurement of AM lattice structures: Uncertainty in calibrated reference object measurement, Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology, [online], https://doi.org/10.1016/j.precisioneng.2022.05.010, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=931613 (Accessed November 14, 2025)