Thermographic and FE Simulation of the DMLS Process at NIST
Brandon M. Lane, Li Ma, Shawn P. Moylan, M A. Donmez, Eric P. Whitenton, Daniel J. Falvey
A major effort of the Measurement Science for Additive Manufacturing Program at NIST is to provide high quality, well-defined temperature measurement of the DMLS process to support and validate multi-physics simulations. However, the dynamic, complex nature of the high temperature zone poses multiple challenges to both simulation efforts and thermographic validation. This talk will present recent thermography and FE simulation results, detail the challenges and contributors to measurement uncertainty, and discuss potential solutions to accurately compare thermography and simulations results.