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Thermal Diffusivity of AIN Using the Photothermal Deflection Technique

Published

Author(s)

E J. Gonzalez

Abstract

The thermal conductivity of AIN specimens doped with Y2O3(5 wt.%) was determined using the photothermal deflection technique. The results agree within 10% of measurements previously made using the laser flash method. Thermal measurements on as-fired thin (0.5 mm to 0.8 mm) substrates revealed the presence of a surface layer of thermal conductivity approximately 50% lower than the interior of the sample.
Proceedings Title
Proceedings: International Symposium on Aluminum Nitride Ceramics: Processing and Evaluation. March 8-11, Tokyo, Japan
Conference Dates
March 1, 0008
Conference Location
Tokyo, 1, JA
Conference Title
Symposium on Aluminum Nitride Ceramics: Processing and Evaluation

Keywords

aluminum nitride, microstructure, sintering, surface properties, thermal conductivity, thermal diffusivity

Citation

Gonzalez, E. (2017), Thermal Diffusivity of AIN Using the Photothermal Deflection Technique, Proceedings: International Symposium on Aluminum Nitride Ceramics: Processing and Evaluation. March 8-11, Tokyo, Japan, Tokyo, 1, JA (Accessed April 14, 2024)
Created February 19, 2017