Gonzalez, E.
(2017),
Thermal Diffusivity of AIN Using the Photothermal Deflection Technique, Proceedings: International Symposium on Aluminum Nitride Ceramics: Processing and Evaluation. March 8-11, Tokyo, Japan, Tokyo, 1, JA
(Accessed October 14, 2025)
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Thermal Diffusivity of AIN Using the Photothermal Deflection Technique
Published
Author(s)
Abstract
The thermal conductivity of AIN specimens doped with Y2O3(5 wt.%) was determined using the photothermal deflection technique. The results agree within 10% of measurements previously made using the laser flash method. Thermal measurements on as-fired thin (0.5 mm to 0.8 mm) substrates revealed the presence of a surface layer of thermal conductivity approximately 50% lower than the interior of the sample.Proceedings Title
Proceedings: International Symposium on Aluminum Nitride Ceramics: Processing and Evaluation. March 8-11, Tokyo, Japan
Conference Dates
March 1, 0008
Conference Location
Tokyo, 1, JA
Conference Title
Symposium on Aluminum Nitride Ceramics: Processing and Evaluation
Pub Type
Conferences
Keywords
aluminum nitride, microstructure, sintering, surface properties, thermal conductivity, thermal diffusivity
Citation
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Created February 19, 2017