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Thermal-Conductivity Apparatus for Steady-State, Comparative Measurement of Ceramic Coatings

Published

Author(s)

Andrew J. Slifka

Abstract

An apparatus has been developed to measure the thermal conductivity of ceramic coatings. Since the method uses an infrared microscope for temperature measurement, coatings as thin as 20 m can, in principle, be measured using this technique. This steady-state, comparative measurement method uses the known thermal conductibity of the substrate material as the reference material for heat-flow measurement. The experimental method is validated by measuring a plasma-sprayed coating that has been previously measured using an absolute, steady-state measurement method. The new measurement method has a relative standard uncertainty of about 10%. The measurement of the plasma-sprayed coating gives 0.58 W m-1 K-1 which compares well with the 0.62 W m-1K-1 measured using the absolute method.
Citation
Journal of Research (NIST JRES) -
Volume
105 No. 4

Keywords

guarded hot plate, infrared microscope, thermal conductivity, thermal-barrier coating, yttria-stabilized-zirconia

Citation

Slifka, A. (2000), Thermal-Conductivity Apparatus for Steady-State, Comparative Measurement of Ceramic Coatings, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed June 24, 2024)

Issues

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Created August 1, 2000, Updated February 17, 2017