Testing the image quality of cabinet x-ray systems for security screening: the revised ASTM F792 standard

Published: May 14, 2018

Author(s)

Jack L. Glover, Ronald E. Tosh, Lawrence T. Hudson, Nicholas G. Paulter Jr.
Citation: Journal of Testing and Evaluation
Volume: 46
Pub Type: Journals
Created May 14, 2018, Updated December 03, 2018