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Test-Chamber Imaging Using Spherical Near-Field Scanning

Published

Author(s)

Ronald C. Wittmann, Michael H. Francis

Abstract

Although the theory is straightforward, practical implementation of spherical near-field scanning for evaluating test chambers presents some significant challenges. Among these are the requirement for accurate probe positioning and the difficulty in minimizing support-structure blockage. We will report on recent NIST efforts to mitigate these difficulties and will present our most recent results.
Conference Dates
October 21-26, 2001
Conference Location
Denver, CO, USA
Conference Title
Antenna Measurement Techniques Association

Keywords

field probing, imaging, near-field measurements, spherical scanning, synthetic aperture

Citation

Wittmann, R. and Francis, M. (2001), Test-Chamber Imaging Using Spherical Near-Field Scanning, Antenna Measurement Techniques Association, Denver, CO, USA (Accessed July 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 30, 2001, Updated October 12, 2021