We discuss procedures for calibrating high-speed sampling oscilloscopes at the National Institute of Standards and Technology, and the terminology associated with those calibrations. The discussion clarifies not only the calibration procedures, but how to use the calibrations to perform traceable oscilloscope measurements.
Proceedings Title: ARFTG Microwave Measurement Conference Digest
Conference Dates: November 30, 2006-December 1, 2007
Conference Location: Boulder, CO
Conference Title: ARFTG Microwave Measurement Conference
Pub Type: Conferences
calibration, impedance mismatch, mismatch correction, sampling oscilloscope, terminology